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| author | kanzure <kanzure@gmail.com> | 2009-08-10 17:23:05 -0500 |
|---|---|---|
| committer | kanzure <kanzure@gmail.com> | 2009-08-10 17:23:05 -0500 |
| commit | f14150900e41dd1974c16ba49c4ec49980c9bba8 (patch) | |
| tree | f30ada6cae7d436936ae816a8a1cfaa06456505c | |
| parent | 745da2d5afacf730f40317688b0e2d438d09c2c3 (diff) | |
| download | skdb-f14150900e41dd1974c16ba49c4ec49980c9bba8.tar.gz skdb-f14150900e41dd1974c16ba49c4ec49980c9bba8.zip | |
clean up analytical-instrumentation
| -rw-r--r-- | doc/BOMs/analytical-instrumentation | 300 |
1 files changed, 150 insertions, 150 deletions
diff --git a/doc/BOMs/analytical-instrumentation b/doc/BOMs/analytical-instrumentation index c1ee84f..e207d98 100644 --- a/doc/BOMs/analytical-instrumentation +++ b/doc/BOMs/analytical-instrumentation @@ -1,150 +1,150 @@ -# atomic absorption spectroscopy (AAS) -# atomic fluorescence spectroscopy (AFS) - # alpha particle X-ray spectrometer (APXS) - # capillary electrophoresis (CE) - # chromatography - # colorimetry - # cyclic voltammetry (CV) - # differential scanning calorimetry (DSC) - # electron paramagnetic resonance (EPR) - # electron spin resonance (ESR) - # field flow fractionation (FFF) - # fourier transform spectroscopy (FTIR) - # gas chromatography (GC) - # gas chromatography-mass spectrometry (GC-MS) - # high performance liquid chromatography (HPLC) - # ion microprobe (IM) - # inductively coupled plasma (ICP) - # instrumental mass fractionation (IMF) - # ion selective electrode (ISE) eg. determination of pH - # laser induced breakdown spectroscopy (LIBS) - # mass spectrometry (MS) - # mossbauer spectroscopy - # nuclear magnetic resonance (NMR) - # particle induced X-ray emission spectroscopy (PIXE) - # pyrolysis (PY) - ## gas chromatography (GC) - ## mass spectrometry (MS) - # raman spectroscopy - # refractive index - # resonance enhanced multi-photon ionization (REMPI) - # scanning transmission X-ray microscopy (STXM) - # transmission electron microscopy (TEM) - # X-ray fluorescence spectroscopy (XRF) - # X-ray microscopy (XRM) - # auger electron diffraction (AED) - # auger electron spectroscopy (AES) - # atomic force microscope (AFM) - # appearance potential spectroscopy (APS) - # coaxial impact collision ion scattering spectroscopy (CAICISS) - # cathodoluminescence (CL) - # dynamic vapour sorption (DVS) - # electron backscatter diffraction (EBSD) - # energy dispersive X-ray spectroscopy (EDX) - # electron induced desorption (EID) - # electron probe microanalysis (EPMA) - # electron spectroscopy for chemical analysis; see XPS (ESCA) - # electron stimulated desorption (ESD) - # extended x-ray absorption fine structure (EXAFS) - # field emission microscopy (FEM) - # field ion microscopy-atom probe (FIM-AP) - # fourier transform infrared absorption spectroscopy (FTIR) - ## attenuated total reflection (ATR) - ## grazing incidence (GI) - ## diffuse reflectance (DRIFTS) - # glow discharge mass spectrometry (GDMS) - # glow discharge optical spectroscopy (GDOS) - # grazing incidence small angle X-ray scattering (GISAXS) - # grazing incidence X-ray diffraction (GIXD) - # grazing incidence X-ray reflectivity (GIXR) - # helium atom scattering (HAS) - # high-resolution electron energy loss spectroscopy (HREELS) - # high-resolution transmission electron microscopy (HRTEM) - # ion induced Auger electron spectroscopy (IAES) - # intelligent gravimetric analysis (IGA) - # ion induced X-ray analysis (IIX) - # ion neutralization spectroscopy (INS) - # infrared spectroscopy (IRS) - # ion scattering spectroscopy (ISS) - # low-energy electron diffraction (LEED) - # low-energy electron microscopy (LEEM) - # low-energy ion scattering (LEIS) - # laser induced breakdown spectroscopy (LIBS) - # laser induced plasma spectroscopy (LIPS) - # laser optical emission spectroscopy (LOES) - # light (raman) scattering (LS) - # medium energy ion scattering (MEIS) - # neutron depth profiling (NDP) - # near edge X-ray absorption fine structure (NEXAFS) - # photodesorption (PD) - # potentiodynamic electrochemical impedance spectroscopy (PDEIS) - # photoelectron diffraction (PED, XPD, PhD, ARPEFS) - # particle (or proton) induced X-ray spectroscopy (PIXE) - # rutherford backscattering spectroscopy (RBS) -# reflection electron microscopy (REM) -# reflection high energy electron diffraction (RHEED) -# small angle X-ray scattering (SAXS) -# surface composition by analysis of neutral species and ion-impact radiation (SCANIIR) -# spectroscopic ellipsometry (SE) -# surface enhanced infrared absorption spectroscopy (SEIRA) -# scanning electron microscopy (SEM) -# surface enhanced raman spectroscopy (SERS) -# surface extended X-ray absorption fine structure (SEXAFS) -# scanning ion-conductance microscopy (SICM) -# secondary ion mass spectrometry (SIMS) -# sputtered neutral species mass spectroscopy (SNMS) -# scanning near-field optical microscopy (SNOM) -# scanning probe microscopy (SPM) -# scanning tunneling microscopy (STM) -# transmission electron microscopy (TEM) -# total reflection X-ray fluorescence analysis (TXRF) -# UV-photoelectron spectroscopy (UPS) -# wide angle X-ray scattering (WAXS) -# X-ray induced auger electron spectroscopy (XAES) -# X-ray crystal truncation rod scattering (X-CTR) -# X-ray diffuse scattering (XDS) -# X-ray photoelectron emission microscopy (XPEEM) -# X-ray photoelectron spectroscopy (XPS) -# X-ray reflectivity (XR) -# X-ray diffraction (XRD) -# X-ray fluorescence analysis (XRF) -# X-ray standing wave technique (XSW) -# chromatography -# high performance liquid chromatography -# ion chromatography -# supercritical fluid chromatography -# capillary electrophoresis -# planar chromatography -# infrared spectrometry (dispersive and fourier transform) -# raman spectrometry -# nuclear magnetic resonance spectrometry -# X-ray spectrometry -# atomic absorption spectrometry -# inductively coupled plasma atomic emission spectrometry -# inductively coupled plasma mass spectrometry -# atomic fluorescence spectrometry -# visible/ultraviolet spectrometry -# molecular fluorescence spectrometry -# chemiluminescence spectrometry -# x-ray fluorescence spectrometry -# electron ionization mass spectroscopy -# chemical ionization mass spectroscopy -# gas chromatography mass spectrometry -# fast atom bombardments mass spectroscopy -# high-performance liquid chromatography mass spectroscopy -# laser mass spectroscopy -# amperometric techniques -# voltammetric techniques -# potentiometric techniques -# conductiometric techniques -# atomic force microscopy -# scanning tunneling microscopy -# auger electron spectrometry -# x-ray photon electron spectrometry -# secondary ion mass spectroscopy -# size exclusion chromatography -# low-angle laser light scattering -# light obscuration particle size techniques -# pyrolysis techniques -# thermal techniques -# mechanical property techniques +atomic absorption spectroscopy (AAS) +atomic fluorescence spectroscopy (AFS) +alpha particle X-ray spectrometer (APXS) +capillary electrophoresis (CE) +chromatography +colorimetry +cyclic voltammetry (CV) +differential scanning calorimetry (DSC) +electron paramagnetic resonance (EPR) +electron spin resonance (ESR) +field flow fractionation (FFF) +fourier transform spectroscopy (FTIR) +gas chromatography (GC) +gas chromatography-mass spectrometry (GC-MS) +high performance liquid chromatography (HPLC) +ion microprobe (IM) +inductively coupled plasma (ICP) +instrumental mass fractionation (IMF) +ion selective electrode (ISE) eg. determination of pH +laser induced breakdown spectroscopy (LIBS) +mass spectrometry (MS) +mossbauer spectroscopy +nuclear magnetic resonance (NMR) +particle induced X-ray emission spectroscopy (PIXE) +pyrolysis (PY) +gas chromatography (GC) +mass spectrometry (MS) +raman spectroscopy +refractive index +resonance enhanced multi-photon ionization (REMPI) +scanning transmission X-ray microscopy (STXM) +transmission electron microscopy (TEM) +X-ray fluorescence spectroscopy (XRF) +X-ray microscopy (XRM) +auger electron diffraction (AED) +auger electron spectroscopy (AES) +atomic force microscope (AFM) +appearance potential spectroscopy (APS) +coaxial impact collision ion scattering spectroscopy (CAICISS) +cathodoluminescence (CL) +dynamic vapour sorption (DVS) +electron backscatter diffraction (EBSD) +energy dispersive X-ray spectroscopy (EDX) +electron induced desorption (EID) +electron probe microanalysis (EPMA) +electron spectroscopy for chemical analysis; see XPS (ESCA) +electron stimulated desorption (ESD) +extended x-ray absorption fine structure (EXAFS) +field emission microscopy (FEM) +field ion microscopy-atom probe (FIM-AP) +fourier transform infrared absorption spectroscopy (FTIR) +attenuated total reflection (ATR) +grazing incidence (GI) +diffuse reflectance (DRIFTS) +glow discharge mass spectrometry (GDMS) +glow discharge optical spectroscopy (GDOS) +grazing incidence small angle X-ray scattering (GISAXS) +grazing incidence X-ray diffraction (GIXD) +grazing incidence X-ray reflectivity (GIXR) +helium atom scattering (HAS) +high-resolution electron energy loss spectroscopy (HREELS) +high-resolution transmission electron microscopy (HRTEM) +ion induced Auger electron spectroscopy (IAES) +intelligent gravimetric analysis (IGA) +ion induced X-ray analysis (IIX) +ion neutralization spectroscopy (INS) +infrared spectroscopy (IRS) +ion scattering spectroscopy (ISS) +low-energy electron diffraction (LEED) +low-energy electron microscopy (LEEM) +low-energy ion scattering (LEIS) +laser induced breakdown spectroscopy (LIBS) +laser induced plasma spectroscopy (LIPS) +laser optical emission spectroscopy (LOES) +light (raman) scattering (LS) +medium energy ion scattering (MEIS) +neutron depth profiling (NDP) +near edge X-ray absorption fine structure (NEXAFS) +photodesorption (PD) +potentiodynamic electrochemical impedance spectroscopy (PDEIS) +photoelectron diffraction (PED, XPD, PhD, ARPEFS) +particle (or proton) induced X-ray spectroscopy (PIXE) +rutherford backscattering spectroscopy (RBS) +reflection electron microscopy (REM) +reflection high energy electron diffraction (RHEED) +small angle X-ray scattering (SAXS) +surface composition by analysis of neutral species and ion-impact radiation (SCANIIR) +spectroscopic ellipsometry (SE) +surface enhanced infrared absorption spectroscopy (SEIRA) +scanning electron microscopy (SEM) +surface enhanced raman spectroscopy (SERS) +surface extended X-ray absorption fine structure (SEXAFS) +scanning ion-conductance microscopy (SICM) +secondary ion mass spectrometry (SIMS) +sputtered neutral species mass spectroscopy (SNMS) +scanning near-field optical microscopy (SNOM) +scanning probe microscopy (SPM) +scanning tunneling microscopy (STM) +transmission electron microscopy (TEM) +total reflection X-ray fluorescence analysis (TXRF) +UV-photoelectron spectroscopy (UPS) +wide angle X-ray scattering (WAXS) +X-ray induced auger electron spectroscopy (XAES) +X-ray crystal truncation rod scattering (X-CTR) +X-ray diffuse scattering (XDS) +X-ray photoelectron emission microscopy (XPEEM) +X-ray photoelectron spectroscopy (XPS) +X-ray reflectivity (XR) +X-ray diffraction (XRD) +X-ray fluorescence analysis (XRF) +X-ray standing wave technique (XSW) +chromatography +high performance liquid chromatography +ion chromatography +supercritical fluid chromatography +capillary electrophoresis +planar chromatography +infrared spectrometry (dispersive and fourier transform) +raman spectrometry +nuclear magnetic resonance spectrometry +X-ray spectrometry +atomic absorption spectrometry +inductively coupled plasma atomic emission spectrometry +inductively coupled plasma mass spectrometry +atomic fluorescence spectrometry +visible/ultraviolet spectrometry +molecular fluorescence spectrometry +chemiluminescence spectrometry +x-ray fluorescence spectrometry +electron ionization mass spectroscopy +chemical ionization mass spectroscopy +gas chromatography mass spectrometry +fast atom bombardments mass spectroscopy +high-performance liquid chromatography mass spectroscopy +laser mass spectroscopy +amperometric techniques +voltammetric techniques +potentiometric techniques +conductiometric techniques +atomic force microscopy +scanning tunneling microscopy +auger electron spectrometry +x-ray photon electron spectrometry +secondary ion mass spectroscopy +size exclusion chromatography +low-angle laser light scattering +light obscuration particle size techniques +pyrolysis techniques +thermal techniques +mechanical property techniques |